Circuits & Systems Measurement



Characterization of millimeter wave subsystems & devices
On wafer testing
Parameter extraction.
Millimeter wave on wafer calibration standard.
S parameter and I-V curves of RF devices.
Features
Phase noise measurement upto 110 GHz with Harmonic Mixe.
Low Phase noise upto – 180dBc/Hz @10KHz offset
Features
Single instrument Noise Figure Measurement up to 26.5 GHz and beyond different Noise sources.

